M. A. Elmessary : rechercher sur Z-Library

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1

FinFET versus Gate-All-Around Nanowire FET: Performance, Scaling and Variability

Nagy, Daniel, Indalecio, Guillermo, Indalecio, Guillermo, Garcia-Loureiro, Antonio J., Elmessary, Muhammad A., Elmessary, Muhammad A., Kalna, Karol, Seoane, Natalia

Journal:

IEEE Journal of the Electron Devices Society

Année:

2018

Langue:

english

Fichier:

PDF, 5.29 MB

english, 2018

2

Scaling/LER study of Si GAA nanowire FET using 3D finite element Monte Carlo simulations

Elmessary, Muhammad A., Nagy, Daniel, Aldegunde, Manuel, Seoane, Natalia, Indalecio, Guillermo, Lindberg, Jari, Dettmer, Wulf, Perić, Djordje, García-Loureiro, Antonio J., Kalna, Karol

Journal:

Solid-State Electronics

Année:

2017

Langue:

english

Fichier:

PDF, 1.54 MB

english, 2017

3

Simulation study of scaled In 0.53 Ga 0.47 As and Si FinFETs for sub-16 nm technology nodes

Seoane, N, Aldegunde, M, Nagy, D, Elmessary, M A, Indalecio, G, García-Loureiro, A J, Kalna, K

Journal:

Semiconductor Science and Technology

Année:

2016

Langue:

english

Fichier:

PDF, 1.83 MB

english, 2016

4

Metal Grain Granularity Study on a Gate-All-Around Nanowire FET

Nagy, Daniel, Indalecio, Guillermo, Garcia-Loureiro, Antonio J., Elmessary, Muhammad A., Kalna, Karol, Seoane, Natalia

Journal:

IEEE Transactions on Electron Devices

Année:

2017

Langue:

english

Fichier:

PDF, 2.75 MB

english, 2017

5

Solitary solution and energy for the Kadomstev–Petviashvili equation in two temperatures charged dusty grains

E. K. El-Shewy, M. I. Abo el Maaty, H. G. Abdelwahed, M. A. Elmessary

Journal:

Astrophysics and Space Science

Année:

2011

Langue:

english

Fichier:

PDF, 554 KB

english, 2011

6

Dust acoustic shock waves in two temperatures charged dusty grains

El-Shewy, E. K., Abdelwahed, H. G., Elmessary, M. A.

Journal:

Physics of Plasmas

Année:

2011

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2011

7

Dust Acoustic Solitary Waves in Saturn F-ring's Region

El-Shewy, E.K, Maaty, M.I. Abo el, Abdelwahed, H.G, Elmessary, M.A

Journal:

Communications in Theoretical Physics

Année:

2011

Langue:

english

Fichier:

PDF, 258 KB

english, 2011

8

[IEEE 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - Stockholm, Sweden (2014.04.7-2014.04.9)] 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - 3D Monte Carlo study of scaled SOI FinFETs using 2D Schrödinger quantum corrections

Elmessary, Muhammad A., Nagy, Daniel, Aldegunde, Manuel, Lindberg, Jari, Dettmer, Wulf G., Peric, Djordje, Garcia-Loureiro, Antonio J., Martinez, Antonio, Kalna, Karol

Année:

2014

Langue:

english

Fichier:

PDF, 631 KB

english, 2014

9

[IEEE 2014 International Workshop on Computational Electronics (IWCE) - Paris, France (2014.6.3-2014.6.6)] 2014 International Workshop on Computational Electronics (IWCE) - 3D Finite Element Schrödinger equation corrected Monte Carlo simulations of nanoscale FinFETs

Nagy, D., Elmessary, M. A., Aldegunde, M., Lindberg, J., Dettmer, W., Peric, D., Loureiro, A., Kalna, K.

Année:

2014

Langue:

english

Fichier:

PDF, 301 KB

english, 2014

10

3-D Finite Element Monte Carlo Simulations of Scaled Si SOI FinFET With Different Cross Sections

Nagy, Daniel, Elmessary, Muhammad A., Aldegunde, Manuel, Valin, Raul, Martinez, Antonio, Lindberg, Jari, Dettmer, Wulf G., Peric, Djordje, Garcia-Loureiro, Antonio J., Kalna, Karol

Journal:

IEEE Transactions on Nanotechnology

Année:

2015

Langue:

english

Fichier:

PDF, 1.12 MB

english, 2015

11

Comparison of Fin-Edge Roughness and Metal Grain Work Function Variability in InGaAs and Si FinFETs

Seoane, Natalia, Indalecio, Guillermo, Aldegunde, Manuel, Nagy, Daniel, Elmessary, Muhammad A., Garcia-Loureiro, Antonio J., Kalna, Karol

Journal:

IEEE Transactions on Electron Devices

Année:

2016

Langue:

english

Fichier:

PDF, 3.83 MB

english, 2016

12

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Multi-subband interface roughness scattering using 3D Finite Element Monte Carlo with 2D Schödinger equation for simulations of sub-16nm FinFETs

Nagy, Daniel, Elmessary, Muhammad A., Aldegunde, Manuel, Lindberg, Jari, Garcia-Loureiro, Antonio J., Kalna, Karol

Année:

2015

Langue:

english

Fichier:

PDF, 641 KB

english, 2015

13

[IEEE 2015 International Workshop on Computational Electronics (IWCE) - West Lafayette, IN, USA (2015.9.2-2015.9.4)] 2015 International Workshop on Computational Electronics (IWCE) - Multi-subband interface roughness scattering using 2D finite element schodinger equation for monte carlo simulations of multi-gate transistors

Nagy, Daniel, Elmessary, Muhammad A., Aldegunde, Manuel, Lindberg, Jari, Garcia-Loureiro, Antonio J., Kalna, Karol

Année:

2015

Langue:

english

Fichier:

PDF, 962 KB

english, 2015

14

[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Scaling/LER study of Si GAA nanowire FET using 3D Finite Element Monte Carlo simulations

Elmessary, Muhammad A., Nagy, Daniel, Aldegunde, Manuel, Seoane, Natalia, Indalecio, Guillermo, Lindberg, Jari, Dettmer, Wulf, Peric, Djordje, Garcia-Loureiro, Antonio J., Kalna, Karol

Année:

2016

Langue:

english

Fichier:

PDF, 524 KB

english, 2016

15

[IEEE 2015 International Workshop on Computational Electronics (IWCE) - West Lafayette, IN, USA (2015.9.2-2015.9.4)] 2015 International Workshop on Computational Electronics (IWCE) - Anisotropic schrodinger equation quantum corrections for 3D Monte Carlo simulations of nanoscale multigate transistors

Elmessary, Muhammad A., Nagy, Daniel, Aldegunde, Manuel, Lindberg, Jari, Dettmer, Wulf, Peric, Djordje, Garcıa-Loureiro, Antonio J., Kalna, Karol

Année:

2015

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2015

16

The effect of interface roughness scattering on Si SOI FinFET with Ando's and extended Prange and Nee model

Nagy, D, Elmessary, M A, Aldegunde, M, Kalna, K

Journal:

Journal of Physics Conference Series

Année:

2015

Langue:

english

Fichier:

PDF, 790 KB

english, 2015

17

[IEEE ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC) - Leuven, Belgium (2017.9.11-2017.9.14)] 2017 47th European Solid-State Device Research Conference (ESSDERC) - Study of strained effects in nanoscale GAA nanowire FETs using 3D Monte Carlo simulations

Elmessary, Muhammad A., Nagy, Daniel, Aldegunde, Manuel, Garcia-Loureiro, Antonio J., Kalna, Karol

Année:

2017

Langue:

english

Fichier:

PDF, 2.41 MB

english, 2017

18

Modelling of Nanoscale Multi-Gate Transistors Affected by Atomistic Interface Roughness

Nagy, Daniel, Aldegunde, Manuel, Elmessary, Muhammad A, Garcia-Loureiro, Antonio, Seoane, Natalia, Kalna, Karol

Journal:

Journal of Physics Condensed Matter

Année:

2018

Langue:

english

Fichier:

PDF, 2.54 MB

english, 2018

19

Spatial Sensitivity of Silicon GAA Nanowire FETs under Line Edge Roughness Variations

Indalecio, Guillermo, Garcia-Loureiro, Antonio J., Elmessary, Muhammad A., Kalna, Karol, Seoane, Natalia

Journal:

IEEE Journal of the Electron Devices Society

Année:

2018

Langue:

english

Fichier:

PDF, 2.36 MB

english, 2018

20

Drift-Diffusion Versus Monte Carlo Simulated On-Current Variability in Nanowire FETs

Nagy, Daniel, Indalecio, Guillermo, Garcma-Loureiro, Antonio J., Espiqeira, Gabriel, Elmessary, Muhammad A., Kalna, Karol, Seoane, Natalia

Journal:

Année:

2019

Langue:

english

Fichier:

PDF, 9 KB

english, 2019

21

Cost of managing patients with venous leg ulcers

Phillips, Ceri J., Humphreys, Ioan, Thayer, Dan, Elmessary, Muhammad, Collins, Huw, Roberts, Chris, Naik, Gurudutt, Harding, Keith

Journal:

International Wound Journal

Année:

2020

Fichier:

PDF, 1008 KB

2020